Spectron Engineering SE590 - Data Format

The data format of single measurement by the SE590 consists of two header lines of data description and 121 data values for wavelengths from 400 to 1000 nanometers, every 5 nanometers. The two header lines are the same for both processing level of the data.

Bi-directional Reflectance Data Header

First header line:
    Measurement code, Observation counter, Apparent solar zenith angle, View zenith angle, Day of year, Year, HourMinute time, Second time, Solar zenith angle, Solar azimuth angle, Site name, Species name, Plot number, Number of scans averaged, Integration time of scans, Month, Day, Year, Hour, Minute Second.
    where Measurement code is

where Plot number 1 are measurements in the principle plane of the sun and Plot number 101 are measurements perpendicular to the principle plane of the sun.

Second header line:
  Photograph number, Description

Leaf Optical Data Header

Deciduous Leaf Data Header Format

First header line:
    Surface code, Observation counter, Day of year (A), HourMinute time (A), Day of Year (B), HourMinute time (B), Year, Site name, Species name, Height in canopy, Location, Branch, Sample code, Age of sample, Replication, Number of scans averaged, Integration time of scans, Month, Day, Year, Hour, Minute, Second.
    where Surface code is

Second header line:
  Optical Property, Munsell Color Code for this surface, Description.

Needle & Twig Data Header Format

First header line:
    Surface code, Observation counter, Day of year (A), HourMinute time (A), Day of Year (B), HourMinute time (B), Year, Site name, Species name, Height in canopy, Location, Branch, Sample code, Age of sample, Replication, Number of scans averaged, Integration time of scans, Month, Day, Year, Hour, Minute, Second.
    where Surface code is

Second header line:
  Optical Property, Munsell Color Code for this surface, Gap Fraction.

Data Block

Values listed by wavelength in nanometers